Shell Thickness Dependence of the Plasmon-Induced Hot-Electron Injection Process in Au@CdS Core-Shell Nanocrystals

Huifang Dong, Jingwen Feng, Jia Liu, Xiaodong Wan, Jiatao Zhang, Zhuan Wang, Hailong Chen*, Yu Xiang Weng

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

15 引用 （Scopus）

指纹

探究 'Shell Thickness Dependence of the Plasmon-Induced Hot-Electron Injection Process in Au@CdS Core-Shell Nanocrystals' 的科研主题。它们共同构成独一无二的指纹。

Engineering

Material Science