Secrecy outage analysis over fluctuating two-ray fading channels

Hui Zhao, Liang Yang, Gaofeng Pan*, Mohamed Slim Alouini

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

8 引用 (Scopus)
Plum Print visual indicator of research metrics
  • Citations
    • Citation Indexes: 9
  • Captures
    • Readers: 2
see details

摘要

In this Letter, the authors analyse the secrecy outage probability (SOP) over fluctuating two-ray fading channels but with a different definition from the one adopted in Zeng et al. Following the new defined SOP, they derive an analytical closed-form expression for their proposed SOP, as well as an asymptotic formula valid in the high signal-to-noise ratio region of the source to destination link. In the numerical results section, they perform some Monte-Carlo simulations to validate the accuracy of their derived expressions, and also present the probability gap between their proposed SOP and the SOP in Zeng et al. .

源语言英语
页(从-至)866-868
页数3
期刊Electronics Letters
55
15
DOI
出版状态已出版 - 25 7月 2019
已对外发布

指纹

探究 'Secrecy outage analysis over fluctuating two-ray fading channels' 的科研主题。它们共同构成独一无二的指纹。

引用此

Zhao, H., Yang, L., Pan, G., & Alouini, M. S. (2019). Secrecy outage analysis over fluctuating two-ray fading channels. Electronics Letters, 55(15), 866-868. https://doi.org/10.1049/el.2019.1104