摘要
The initial growth of bismuth (Bi) on epitaxial graphene (EG) on SiC(0001) at low deposition rates has been investigated using low temperature scanning tunneling microscopy (LT-STM) and synchrotron-based photoemission spectroscopy (PES). PES measurements reveal an islanding growth mode of Bi on EG due to weak interfacial interactions. LT-STM measurements show that Bi forms one-dimensional (1D) 4-monolayer-thick nanoribbons on EG with the orientation relationship of Bi(011¯2) ∥ EG(0001) and Bi〈112¯0〉 aligned well with EG〈112¯0〉. Scanning tunneling spectroscopy (STS) results reveal the semiconducting nature of such Bi nanoribbons.
源语言 | 英语 |
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页(从-至) | 24995-24999 |
页数 | 5 |
期刊 | Journal of Physical Chemistry C |
卷 | 118 |
期 | 43 |
DOI | |
出版状态 | 已出版 - 30 10月 2014 |
已对外发布 | 是 |