Robust power-on reset circuit with brown-out detection

Bo Zhou*, Yan Jun Zhang, Zhen Yu Liu, Da Ke Liu

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

2 引用 (Scopus)

摘要

An on-chip power-on reset circuit with a brown-out detection capability is implemented in a 0.18 μm CMOS. A pF-order capacitor is charged with a proportional-to-absolute-temperature (PTAT) current from a bandgap reference with limited loop bandwidth and slow start-up feature, to generate a reset signal with high robustness and wide-range supply rise time. An embedded brown-out detector based on complementary voltage-to-current (V-to-I) conversion and current comparison can accurately respond to the brown-out event with high robustness over process and temperature when the supply is lower than 1.5 V and the brown-out duration is longer than 0.1 ms. The presented design with embedded offset voltage cancellation consumes a quiescent current of 8.5 μA from a 1.8 V supply and works over ambient temperature of -40° to 120°.

源语言英语
页(从-至)53-57
页数5
期刊Journal of Beijing Institute of Technology (English Edition)
23
1
出版状态已出版 - 3月 2014

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