摘要
An on-chip power-on reset circuit with a brown-out detection capability is implemented in a 0.18 μm CMOS. A pF-order capacitor is charged with a proportional-to-absolute-temperature (PTAT) current from a bandgap reference with limited loop bandwidth and slow start-up feature, to generate a reset signal with high robustness and wide-range supply rise time. An embedded brown-out detector based on complementary voltage-to-current (V-to-I) conversion and current comparison can accurately respond to the brown-out event with high robustness over process and temperature when the supply is lower than 1.5 V and the brown-out duration is longer than 0.1 ms. The presented design with embedded offset voltage cancellation consumes a quiescent current of 8.5 μA from a 1.8 V supply and works over ambient temperature of -40° to 120°.
源语言 | 英语 |
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页(从-至) | 53-57 |
页数 | 5 |
期刊 | Journal of Beijing Institute of Technology (English Edition) |
卷 | 23 |
期 | 1 |
出版状态 | 已出版 - 3月 2014 |