TY - GEN
T1 - Robust multiscale design using PATC and WSRSM
AU - Xiong, Fenfen
AU - Sun, Gaorong
AU - Zhao, Liangyu
PY - 2011
Y1 - 2011
N2 - Multiscale design dealing with 2-scale material and product system is implemented by employing probabilistic analytical target cascading (PATC) and weighted stochastic response surface method (WSRSM) in this paper. PATC allows design autonomy at each scale subsystem by formulating the multiscale design system as a multilevel structure. WSRSM ensures uncertainties to be propagated within and across each scale accurately and efficiently. Comparative study on a multiscale bracket design problem shows that the results obtained by our strategy are very close to the reference values. It is demonstrated that PATC and WSRSM are highly effective and applicable on multiscale design.
AB - Multiscale design dealing with 2-scale material and product system is implemented by employing probabilistic analytical target cascading (PATC) and weighted stochastic response surface method (WSRSM) in this paper. PATC allows design autonomy at each scale subsystem by formulating the multiscale design system as a multilevel structure. WSRSM ensures uncertainties to be propagated within and across each scale accurately and efficiently. Comparative study on a multiscale bracket design problem shows that the results obtained by our strategy are very close to the reference values. It is demonstrated that PATC and WSRSM are highly effective and applicable on multiscale design.
KW - Material and product design
KW - Multiscale design
KW - Probabilistic analytical target cascading
KW - Weighted stochastic response surface method
UR - http://www.scopus.com/inward/record.url?scp=78650675390&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.148-149.1075
DO - 10.4028/www.scientific.net/AMR.148-149.1075
M3 - Conference contribution
AN - SCOPUS:78650675390
SN - 9780878492015
T3 - Advanced Materials Research
SP - 1075
EP - 1078
BT - Manufacturing Processes and Systems
T2 - 2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010
Y2 - 6 November 2010 through 8 November 2010
ER -