摘要
Reliability test information entropy of pass-fail product and particularity of high reliability product with margin were studied. Results show that reliability test information entropy is equivalent to reliability test information quantity under the condition of zero failure. The assessment results of 20 kinds of initiating devices with GJB6478 are consistent with those with run-down method.
源语言 | 英语 |
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页(从-至) | 550-552 |
页数 | 3 |
期刊 | Hanneng Cailiao/Chinese Journal of Energetic Materials |
卷 | 16 |
期 | 5 |
出版状态 | 已出版 - 10月 2008 |