@inproceedings{252d04b0ad8b4b2a9995b94422517716,
title = "Reliability analysis for gap null gate by bivariate T-distribution",
abstract = "The length of the reliability window is the key problem in designing the gap explosive null gate. Either too long or too short of the length will lead the gap null gate failure. This paper regards the two threshold values of the gap null gate as variables and formulates the reliability window as a triple response problem. Using bivariate t-distribution, this paper presents the probability model of the successful response. The parameters in the model are estimated by constructing score test statistics. To illustrate the effectiveness of the method presented in the paper, an example of how to derive the reliability window based on experimental data is shown at the end of the paper.",
keywords = "Gap null gate, bivariate t-distribution, reliability window, score test",
author = "Houbao Xu and Mei Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 ; Conference date: 10-12-2017 Through 13-12-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/IEEM.2017.8290214",
language = "English",
series = "IEEE International Conference on Industrial Engineering and Engineering Management",
publisher = "IEEE Computer Society",
pages = "1863--1867",
booktitle = "2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017",
address = "United States",
}