摘要
The length of the reliability window is the key problem in designing the gap explosive null gate. Either too long or too short of the length will lead the gap null gate failure. This paper regards the two threshold values of the gap null gate as variables and formulates the reliability window as a triple response problem. Using bivariate t-distribution, this paper presents the probability model of the successful response. The parameters in the model are estimated by constructing score test statistics. To illustrate the effectiveness of the method presented in the paper, an example of how to derive the reliability window based on experimental data is shown at the end of the paper.
| 源语言 | 英语 |
|---|---|
| 主期刊名 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 |
| 出版商 | IEEE Computer Society |
| 页 | 1863-1867 |
| 页数 | 5 |
| ISBN（电子版） | 9781538609484 |
| DOI | |
| 出版状态 | 已出版 - 2 7月 2017 |
| 活动 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 - Singapore, 新加坡 期限: 10 12月 2017 → 13 12月 2017 |
出版系列
| 姓名 | IEEE International Conference on Industrial Engineering and Engineering Management |
|---|---|
| 卷 | 2017-December |
| ISSN（印刷版） | 2157-3611 |
| ISSN（电子版） | 2157-362X |
会议
| 会议 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 |
|---|---|
| 国家/地区 | 新加坡 |
| 市 | Singapore |
| 时期 | 10/12/17 → 13/12/17 |
指纹
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Xu, H., & Li, M. (2017). Reliability analysis for gap null gate by bivariate T-distribution. 在 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 (页码 1863-1867). (IEEE International Conference on Industrial Engineering and Engineering Management; 卷 2017-December). IEEE Computer Society. https://doi.org/10.1109/IEEM.2017.8290214