Reflectance Anisotropy from MODIS for Albedo Retrieval from a Single Directional Reflectance

Hu Zhang, Mengzhuo Zhao, Ziti Jiao*, Yi Lian, Lei Chen, Lei Cui, Xiaoning Zhang, Yan Liu, Yadong Dong, Da Qian, Yiting Wang, Juan Li, Tiejun Cui

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

4 引用 (Scopus)

摘要

Surface reflectance anisotropy and insufficient multi-angular observations are the main challenges in albedo estimation from satellite observations. Numerous studies have been developed for albedo retrieval from a single directional reflectance by associating the anisotropy information extracted from coarse-resolution bidirectional-reflectance distribution function (BRDF) data. The contribution of land-cover type (LCT) and the Normalized Difference Vegetation Index (NDVI) in distinguishing reflectance anisotropy in these methods remains controversial. This study first proposed an approach to extracting a priori BRDF (F) from the MODIS BRDF/albedo product by considering the distribution characteristics of the model parameters. LCT- and NDVI-based F were also extracted from the corresponding subset. Then, the F-based albedo was derived from simulated or satellite directional reflectance and the anisotropic information of F. Finally, the directional reflectance and F-based albedo were compared with the MODIS albedo or ground measurement, in order to show the ability of F to compensate for the effect of reflectance anisotropy in the albedo retrieval process. The method was fully validated by the global and time-series MODIS BRDF data. The results showed that reflectance anisotropy has an aggregated distribution pattern, and F can represent the reflectance anisotropy of most pixels within a tile. The improvement of LCT and NDVI only occurs when the tile contains a large area of vegetated and barren ground. With the exception of the hotspot and large viewing-zenith-angle area in the forward hemisphere, the F-based shortwave albedo has high consistency with the MODIS albedo product. A comparison with the ground measurements and MODIS albedo showed that the F-based albedo from a single directional reflectance generally achieves an absolute accuracy requirement, with a root-mean-square error (RMSE) of 0.027 and 0.036.

源语言英语
文章编号3627
期刊Remote Sensing
14
15
DOI
出版状态已出版 - 8月 2022
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