摘要
By considering the interaction between charge carriers recombination and transport through the bulk at high fields, the expression of recombination efficiency for single-layer diodes is presented. By parameters calculation, a maximum recombination efficiency is promised for device ITO/ MEH-PPV(120 nm)/Ca, and the same experimental fact for ITO/BEH-PPV(100 nm)/Ca [Y. Kawabe, et al., J. Appl. Phys. 84, 5306 (1998)] proved our theoretical prediction.
源语言 | 英语 |
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页(从-至) | 2529-2531 |
页数 | 3 |
期刊 | Applied Physics Letters |
卷 | 79 |
期 | 16 |
DOI | |
出版状态 | 已出版 - 15 10月 2001 |
已对外发布 | 是 |