TY - JOUR
T1 - Real-time far distance micro-vibration measurement using an external cavity semiconductor laser interferometer with a feedback control system
AU - Zhao, Weirui
AU - Jiang, Pengfei
AU - Xie, Fuzeng
N1 - Publisher Copyright:
© 2002 SPIE.
PY - 2002/9/20
Y1 - 2002/9/20
N2 - An external cavity semiconductor laser interferometer used to measure far distance micro-vibration in real time is proposed. In the interferometer, a single longitudinal mode and excellent coherent characteristic grating external cavity semiconductor laser is constructed and acted as a light source and a phase compensator. Its coherent length exceeds 200 meters. The angle between normal and incidence beam of the far object is allowed to change in definite range during the measurement with this interferometer, and this makes the far distance interference measurement easier and more convenient. Also, it is not required to keep the amplitudes of the first and second harmonic components equal, and then the dynamic range is increased. A feedback control system is used to compensate the phase disturbance between the two interference beams introduced by environmental vibration.
AB - An external cavity semiconductor laser interferometer used to measure far distance micro-vibration in real time is proposed. In the interferometer, a single longitudinal mode and excellent coherent characteristic grating external cavity semiconductor laser is constructed and acted as a light source and a phase compensator. Its coherent length exceeds 200 meters. The angle between normal and incidence beam of the far object is allowed to change in definite range during the measurement with this interferometer, and this makes the far distance interference measurement easier and more convenient. Also, it is not required to keep the amplitudes of the first and second harmonic components equal, and then the dynamic range is increased. A feedback control system is used to compensate the phase disturbance between the two interference beams introduced by environmental vibration.
KW - External cavity semiconductor laser interferometer
KW - Far distance
KW - Feedback control
KW - Micro-vibration measurement
UR - http://www.scopus.com/inward/record.url?scp=85076812603&partnerID=8YFLogxK
U2 - 10.1117/12.471707
DO - 10.1117/12.471707
M3 - Conference article
AN - SCOPUS:85076812603
SN - 0277-786X
VL - 4927
SP - 770
EP - 774
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Design and Testing 2002
Y2 - 14 October 2002 through 18 October 2002
ER -