Query-Efficient Hard-Label Black-Box Attacks Using Biased Sampling

Sijia Liu, Jian Sun, Jun Li

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

In recent years, deep learning has developed rapidly and achieved great success in many fields. However, it has been demonstrated that deep neural networks are very vulnerable to artificially designed adversarial examples which are difficult to visually observe by human. In this paper, the practical hard-label black box attack in which attackers can only query the output labels to generate adversarial examples, is studied on image classification tasks. Existing attacks proposed for this setting require a lot of queries. To improve the attack efficiency, the unbiased sampling in existing attacks is replaced with two biased sampling methods: low image frequency and regional mask. The two biased methods integrate domain knowledge into the process of sampling and searching for adversarial directions, which can significantly limit the search space and thus reduce query times. Experimental results on ImageNet show that the biased sampling methods can improve the efficiency of existing hard-label black box attacks.

源语言英语
主期刊名Proceedings - 2020 Chinese Automation Congress, CAC 2020
出版商Institute of Electrical and Electronics Engineers Inc.
3872-3877
页数6
ISBN(电子版)9781728176871
DOI
出版状态已出版 - 6 11月 2020
活动2020 Chinese Automation Congress, CAC 2020 - Shanghai, 中国
期限: 6 11月 20208 11月 2020

出版系列

姓名Proceedings - 2020 Chinese Automation Congress, CAC 2020

会议

会议2020 Chinese Automation Congress, CAC 2020
国家/地区中国
Shanghai
时期6/11/208/11/20

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