Planar alignment sensor based on Rayleigh interference in two wavelengths

Yao Hu*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Precise alignment of planar optical element is common in industry or scientific research. In this paper, a planar alignment sensor based on Rayleigh interference in two wavelengths is proposed. Monochromatic probing lasers in two wavelengths point normally to the two mirror-reflection planes, and the reflective beams carrying alignment information are focused by a lens to form Rayleigh interference patterns at the focal plane. Four-quadrant detectors pick up the patterns and output angular and coplanar adjustment signals according to the rotational-symmetry and axial-symmetry of the pattern. Preliminary experiment demonstrated the feasibility of the method.

源语言英语
主期刊名Optical Design and Testing V
DOI
出版状态已出版 - 2012
活动Optical Design and Testing V - Beijing, 中国
期限: 5 11月 20127 11月 2012

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
8557
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Design and Testing V
国家/地区中国
Beijing
时期5/11/127/11/12

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