Numerical simulation and experimental verification of extended source interferometer

Yinlong Hou, Lin Li, Shanshan Wang*, Xiao Wang, Haijun Zang, Qiudong Zhu

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Extended source interferometer, compared with the classical point source interferometer, can suppress coherent noise of environment and system, decrease dust scattering effects and reduce high-frequency error of reference surface. Numerical simulation and experimental verification of extended source interferometer are discussed in this paper. In order to provide guidance for the experiment, the modeling of the extended source interferometer is realized by using optical design software Zemax. Matlab codes are programmed to rectify the field parameters of the optical system automatically and get a series of interferometric data conveniently. The communication technique of DDE (Dynamic Data Exchange) was used to connect Zemax and Matlab. Then the visibility of interference fringes can be calculated through adding the collected interferometric data. Combined with the simulation, the experimental platform of the extended source interferometer was established, which consists of an extended source, interference cavity and image collection system. The decrease of high-frequency error of reference surface and coherent noise of the environment is verified. The relation between the spatial coherence and the size, shape, intensity distribution of the extended source is also verified through the analysis of the visibility of interference fringes. The simulation result is in line with the result given by real extended source interferometer. Simulation result shows that the model can simulate the actual optical interference of the extended source interferometer quite well. Therefore, the simulation platform can be used to guide the experiment of interferometer which is based on various extended sources.

源语言英语
主期刊名2013 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
出版商SPIE
ISBN(印刷版)9780819499646
DOI
出版状态已出版 - 2013
活动2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 17 11月 201319 11月 2013

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
9046
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期17/11/1319/11/13

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引用此

Hou, Y., Li, L., Wang, S., Wang, X., Zang, H., & Zhu, Q. (2013). Numerical simulation and experimental verification of extended source interferometer. 在 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems 文章 904605 (Proceedings of SPIE - The International Society for Optical Engineering; 卷 9046). SPIE. https://doi.org/10.1117/12.2038097