摘要
A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.
源语言 | 英语 |
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页(从-至) | 2288-2291 |
页数 | 4 |
期刊 | Guangzi Xuebao/Acta Photonica Sinica |
卷 | 37 |
期 | 11 |
出版状态 | 已出版 - 11月 2008 |
已对外发布 | 是 |