Nondestructive ion trap mass analysis at high pressure

Wei Xu; Jeffrey B. Maas; Frank J. Boudreau; William J. Chappell; Zheng Ouyang

doi:10.1021/ac1027808

Nondestructive ion trap mass analysis at high pressure

Wei Xu, Jeffrey B. Maas, Frank J. Boudreau, William J. Chappell, Zheng Ouyang^*

^*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

14 引用（Scopus）

摘要

A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.

源语言	英语
页（从-至）	685-689
页数	5
期刊	Analytical Chemistry
卷	83
期	3
DOI	https://doi.org/10.1021/ac1027808
出版状态	已出版 - 1 2月 2011
已对外发布	是

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Xu, W., Maas, J. B., Boudreau, F. J., Chappell, W. J., & Ouyang, Z. (2011). Nondestructive ion trap mass analysis at high pressure. Analytical Chemistry, 83(3), 685-689. https://doi.org/10.1021/ac1027808

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AU - Xu, Wei

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AU - Boudreau, Frank J.

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AU - Ouyang, Zheng

PY - 2011/2/1

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AB - A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.

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Nondestructive ion trap mass analysis at high pressure

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