摘要
A new method of built-in self-testing for pulse doppler radar digital signal processor was advanced. The method is between board-level testing and system-level testing, integrating system adjustment, on-line testing and off-line testing in one BIT system. The implementation of BIT was offered, and the fault-coverage-rate of "data rearrangement" module was calculated. This method had been successfully applied to a PD radar.
| 源语言 | 英语 |
|---|---|
| 页（从-至） | 748-752 |
| 页数 | 5 |
| 期刊 | Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology |
| 卷 | 17 |
| 期 | 6 |
| 出版状态 | 已出版 - 1997 |