Microstructure variations induced by excess PbX2 or AX within perovskite thin films

Guanhaojie Zheng; Cheng Zhu; Yihua Chen; Juchen Zhang; Qi Chen; Xingyu Gao; Huanping Zhou

doi:10.1039/c7cc07534k

Microstructure variations induced by excess PbX₂ or AX within perovskite thin films

Guanhaojie Zheng, Cheng Zhu, Yihua Chen, Juchen Zhang, Qi Chen, Xingyu Gao^*, Huanping Zhou

^*此作品的通讯作者

前沿交叉科学研究院

科研成果: 期刊稿件 › 文章 › 同行评审

8 引用（Scopus）

摘要

We systematically investigated the impact of stoichiometric ratio variation between PbX₂ and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

源语言	英语
页（从-至）	12966-12969
页数	4
期刊	Chemical Communications
卷	53
期	96
DOI	https://doi.org/10.1039/c7cc07534k
出版状态	已出版 - 2017

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10.1039/c7cc07534k

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abstract = "We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.",

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AU - Zheng, Guanhaojie

AU - Zhu, Cheng

AU - Chen, Yihua

AU - Zhang, Juchen

AU - Chen, Qi

AU - Gao, Xingyu

AU - Zhou, Huanping

PY - 2017

Y1 - 2017

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AB - We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

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Microstructure variations induced by excess PbX2 or AX within perovskite thin films

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Microstructure variations induced by excess PbX₂ or AX within perovskite thin films