摘要
We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.
源语言 | 英语 |
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页(从-至) | 12966-12969 |
页数 | 4 |
期刊 | Chemical Communications |
卷 | 53 |
期 | 96 |
DOI | |
出版状态 | 已出版 - 2017 |
指纹
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Zheng, G., Zhu, C., Chen, Y., Zhang, J., Chen, Q., Gao, X., & Zhou, H. (2017). Microstructure variations induced by excess PbX2 or AX within perovskite thin films. Chemical Communications, 53(96), 12966-12969. https://doi.org/10.1039/c7cc07534k