Microstructure variations induced by excess PbX2 or AX within perovskite thin films

Guanhaojie Zheng, Cheng Zhu, Yihua Chen, Juchen Zhang, Qi Chen, Xingyu Gao*, Huanping Zhou

*此作品的通讯作者

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摘要

We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

源语言英语
页(从-至)12966-12969
页数4
期刊Chemical Communications
53
96
DOI
出版状态已出版 - 2017

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Zheng, G., Zhu, C., Chen, Y., Zhang, J., Chen, Q., Gao, X., & Zhou, H. (2017). Microstructure variations induced by excess PbX2 or AX within perovskite thin films. Chemical Communications, 53(96), 12966-12969. https://doi.org/10.1039/c7cc07534k