摘要
Metal/semiconductor Fex(In2O3)1-x granular films were prepared by the rf-sputtering. The microstructure was studied by using XRD, TEM and magnetic measurements. The results showed that the nanometer-sized Fe particles uniformly dispersed in the amorphous In2O3. Appropriate annealing leads to the crystallization of In2O3 films and the growth of the Fe particle size. As a result, the magnetic behavior of the films transits from superparamagnetic to ferromagnetic. The variation of the lattice constant for In2O3 depends on the volume fraction of Fe particles.
源语言 | 英语 |
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页(从-至) | 1095-1098 |
页数 | 4 |
期刊 | Jinshu Xuebao/Acta Metallurgica Sinica |
卷 | 34 |
期 | 10 |
出版状态 | 已出版 - 10月 1998 |
已对外发布 | 是 |