Micrometer-resolution 3D imaging Lidar based on metalens with strong chromatic dispersion

Wang Lu, Wang Xin*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In recent years, metalens showed their applied potential as depth information sensors. To combine the advantages of active-imaging Lidar and the depth information acquisition ability of metalens, a 3D imaging setup based on metalens array with strong chromatic dispersion was proposed in this paper. When the scene was illuminated by the laser with different wavelengths, the point spread function (PSF) of points in the scene was varied at a certain imaging plane behind the metalens. Only when the point located on the object plane was illuminated by a certain wavelength the optimized PSF could be observed on the imaging plane. Therefore, by measuring the PSFs of a pairs of defocus images induced by the chromatic dispersion of the metalens the absolute distance from metalens to a point on the scene could be obtained. Combined with the clear 2D image, 3D imaging can be realized. When the chromatic dispersion of the metalens is stronger, PSF is more sensitive to the distance change, higher distance measurement resolution can be obtained. The simulation results of metalens with different dispersion shown in the paper proved our assumption.

源语言英语
主期刊名SPIE-CLP Conference on Advanced Photonics 2022
编辑Xu Liu, Anatoly Zayats, Xiaocong Yuan
出版商SPIE
ISBN(电子版)9781510663282
DOI
出版状态已出版 - 2023
活动SPIE-CLP Conference on Advanced Photonics 2022 - Virtual, Online, 中国
期限: 21 11月 202223 11月 2022

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12601
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议SPIE-CLP Conference on Advanced Photonics 2022
国家/地区中国
Virtual, Online
时期21/11/2223/11/22

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引用此

Lu, W., & Xin, W. (2023). Micrometer-resolution 3D imaging Lidar based on metalens with strong chromatic dispersion. 在 X. Liu, A. Zayats, & X. Yuan (编辑), SPIE-CLP Conference on Advanced Photonics 2022 文章 126010Q (Proceedings of SPIE - The International Society for Optical Engineering; 卷 12601). SPIE. https://doi.org/10.1117/12.2667156