Measurement of surface shape and deformation of small-aperture mirrors based on Coaxial normal incidence speckle deflectometry system

Yu Zhang, Yao Hu*, Qun Hao, Shaohui Zhang

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

For small-aperture aspheric mirror surface measurement, the traditional measurement method phase measuring deflectometry (PMD) requires multi-step phase shifting, and the result is not high in accuracy and complicated in operation. The digital image correlation (DIC) that can be used for transient measurement is mostly used for diffuse reflection. surface. At present, a speckle deflection technique combining the former two methods has appeared, but its optical system is based on the traditional triangulation method, which has problems of angle occlusion and defects. This paper improves the speckle deflection algorithm and optical path system, replacing the traditional triangulation optical path system with Coaxial normal incidence speckle deflectometry system (CNISDS), adding a plate beam-splitter and a telecentric camera.On the one hand, it can avoid the changes in the shape of the captured image caused by perspective, and on the other hand, it can effectively avoid angle occlusion and missing information. Among them, the DIC method is used for image matching, the PMD method is used to calculate the displacement distribution. Then use the slope data to calculate to reconstruct the surface shape. The improved method can measure absolute surface shape and deformation at the same time, and has the advantages of simple measurement steps, fast response speed, and low cost. Finally, the correctness and feasibility are verified by simulation and actual measurement with deformable mirror. Compared with the phase-shifting operation which has complex steps or the low-precision mirror profile measurement results, the improved method is effective and superior, and provides a new idea for measuring small-aperture aspheric mirrors.

源语言英语
主期刊名2021 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Jigui Zhu, Lijiang Zeng, Jie Jiang, Sen Han
出版商SPIE
ISBN(电子版)9781510655690
DOI
出版状态已出版 - 2022
活动2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Virtual, Online, 中国
期限: 8 4月 202210 4月 2022

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12282
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Virtual, Online
时期8/04/2210/04/22

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