Measurement of refractive index of optical materials using improved Brewster method

Jiahang Lv, Yao Hu*, Fei Li, Qun Hao

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Refractive index is one of the most important physical parameters of the materials. Owe to its great influence on the working characteristics of an optical systems, high accuracy measurement is required. Many methods have been proposed such as the v-prism method, the minimum deviation angle method, and the interferometric method. However, for the restriction of the principle, the shape of the sample is required to be a parallel plate or a prism with a specific shape. The sample with only spherical or aspheric surfaces cannot be tested. In this paper, an improved Brewster method is proposed to measure the refractive index of optical materials with arbitrary shapes. Brewster law can be expressed as that the reflectivity of the P-polarized light approaches zero when it is incident in the Brewster angle, which is the inverse trigonometric value of the refractive index. In the original method, a parallel laser beam with P polarization is incident on the sample, and reflected by it to a photodiode to get the intensity. The minimum intensity position corresponding to Brewster angle can be found by changing the incident angle. The reflecting surface of the sample need to be planar to provide smooth reflective area with a size greater than the beam diameter. In the improved method, a laser probe focusing on the sample and an array detector are used instead of the parallel beam and the photodiode. The minimum intensity position can be found with image processing technology. Since the laser beam is focused on the sample, only a tiny area with a size of 10 microns for reflection is needed. Thus, whatever the shape of the sample is, the method can be used. In order to demonstrate the feasibility, samples with different shapes such as a prism, a parallel plate and a lens was tested, and the accuracy of the results could all reach the order of magnitude of 10-3.

源语言英语
主期刊名Optical Design and Testing X
编辑Yongtian Wang, Tina E. Kidger, Osamu Matoba, Rengmao Wu
出版商SPIE
ISBN(电子版)9781510639119
DOI
出版状态已出版 - 2020
活动Optical Design and Testing X 2020 - Virtual, Online, 中国
期限: 11 10月 202016 10月 2020

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
11548
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Design and Testing X 2020
国家/地区中国
Virtual, Online
时期11/10/2016/10/20

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