摘要
In this paper, the principle of subaperture stitching interferometry was introduced. A testing stage with five degrees of freedom for stitching interferometry was built. A model based on least-squares method and error averaging method for data processing was established, which could reduce error accumulation and improve the precision. A 100 mm plane mirror was measured with a 50 mm aperture interferometer by means of stitching interferometry. Compared with the results by a 100 mm interferometer, peak to valley (PV) and root mean square (RMS) of the phase distribution residual are 0:0038λ and 0:0004λ, respectively. It proved that the model and method are helpful for large optical measurement.
源语言 | 英语 |
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页(从-至) | 218-223 |
页数 | 6 |
期刊 | Frontiers of Optoelectronics |
卷 | 5 |
期 | 2 |
DOI | |
出版状态 | 已出版 - 6月 2012 |