LYM-Type Inequalities for tEC/AUED Codes

Zhen Zhang; Xiang Gen Xia

doi:10.1109/18.179364

LYM-Type Inequalities for tEC/AUED Codes

Zhen Zhang, Xiang Gen Xia

University of Southern California

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用（Scopus）

摘要

Some LYM-type inequalities are introduced to obtain a relationship between the parameters of t-error correcting/all unidirectional error-detecting (tEC/AUED) codes of length n. As an application of these inequalities, new lower bounds on the redundancies of systematic tED/AUED codes are derived and an extensive table is given.

源语言	英语
页（从-至）	232-238
页数	7
期刊	IEEE Transactions on Information Theory
卷	39
期	1
DOI	https://doi.org/10.1109/18.179364
出版状态	已出版 - 1月 1993
已对外发布	是

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Zhang, Z., & Xia, X. G. (1993). LYM-Type Inequalities for tEC/AUED Codes. IEEE Transactions on Information Theory, 39(1), 232-238. https://doi.org/10.1109/18.179364

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abstract = "Some LYM-type inequalities are introduced to obtain a relationship between the parameters of t-error correcting/all unidirectional error-detecting (tEC/AUED) codes of length n. As an application of these inequalities, new lower bounds on the redundancies of systematic tED/AUED codes are derived and an extensive table is given.",

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LYM-Type Inequalities for tEC/AUED Codes

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