Intraocular lens power estimation by accurate ray tracing for eyes underwent previous refractive surgeries

Que Yang, Shanshan Wang, Kai Wang, Chunyu Zhang, Lu Zhang, Qingyu Meng, Qiudong Zhu

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

For normal eyes without history of any ocular surgery, traditional equations for calculating intraocular lens (IOL) power, such as SRK-T, Holladay, Higis, SRK-II, et al., all were relativley accurate. However, for eyes underwent refractive surgeries, such as LASIK, or eyes diagnosed as keratoconus, these equations may cause significant postoperative refractive error, which may cause poor satisfaction after cataract surgery. Although some methods have been carried out to solve this problem, such as Hagis-L equation[1], or using preoperative data (data before LASIK) to estimate K value[2], no precise equations were available for these eyes. Here, we introduced a novel intraocular lens power estimation method by accurate ray tracing with optical design software ZEMAX. Instead of using traditional regression formula, we adopted the exact measured corneal elevation distribution, central corneal thickness, anterior chamber depth, axial length, and estimated effective lens plane as the input parameters. The calculation of intraocular lens power for a patient with keratoconus and another LASIK postoperative patient met very well with their visual capacity after cataract surgery.

源语言英语
主期刊名2015 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems, OIT 2015
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam, Sen Han
出版商SPIE
ISBN(电子版)9781628418040
DOI
出版状态已出版 - 2015
活动2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015 - Beijing, 中国
期限: 17 5月 201519 5月 2015

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
9623
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015
国家/地区中国
Beijing
时期17/05/1519/05/15

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