Interpretation of buildings in high resolution SAR images based on electromagnetic method

Fengli Zhang*, Yun Shao, Zi Wan, Xiao Zhang

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

4 引用 (Scopus)
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摘要

High resolution SAR (Synthetic Aperture Radar) will provide an innovative tool for urban area applications. Nevertheless, interpretation of SAR image in urban area is far from solved by the increase of spatial resolution. It is usually difficult to establish a determined relationship between scattering centers in high resolution SAR images and the basic units of building targets. In order to thoroughly understand the backscattering behaviour of building targets in high resolution SAR images, a method of high resolution SAR imaging simulation based on electromagnetic model is proposed in this paper, which mainly includes 3-D model establishment for the building target, triangular facets partition, RCS prediction for each facet, and SAR imaging through coherent superposition of echo from each triangular facet. Through comparison of the simulated and the original SAR image, building scatter mechanisms in high resolution SAR images can be well interpreted.

源语言英语
主期刊名2010 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010
出版商Institute of Electrical and Electronics Engineers Inc.
2727-2730
页数4
ISBN(印刷版)9781424495658, 9781424495665
DOI
出版状态已出版 - 2010
已对外发布
活动2010 30th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010 - Honolulu, 美国
期限: 25 7月 201030 7月 2010

出版系列

姓名International Geoscience and Remote Sensing Symposium (IGARSS)

会议

会议2010 30th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010
国家/地区美国
Honolulu
时期25/07/1030/07/10

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引用此

Zhang, F., Shao, Y., Wan, Z., & Zhang, X. (2010). Interpretation of buildings in high resolution SAR images based on electromagnetic method. 在 2010 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010 (页码 2727-2730). 文章 5649761 (International Geoscience and Remote Sensing Symposium (IGARSS)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IGARSS.2010.5649761