Influence of contact resistance on the electrical characteristics of organic static induction transistors

Yong Zhang, Shengyi Yang*, Yurong Jiang, Bingsuo Zou

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

1 引用 (Scopus)

摘要

The influencing factors on the current-voltage (I-V) characteristics of organic static induction transistors (OSITs) are complicated and usually the underneath physical mechanism depends on many parameters. In this paper, firstly we come up with a typical OSIT model and summarize its theoretical equations to the I-V curves of pentacene-based OSIT ITO(Source)/Pentacene/Al(Gate)/Pentacene/Au(Drain) under both negative drain-source voltage and gate voltage (V G), and the influence of contact resistance on OSITs is investigated. Our simulation showed that the injection barriers, the depletion layer and the gate controlling reduce when OSIT approaches the space-charge-limited current mode by decreasing the negative V G, which confirms our previous supposal that the contact resistance at the interfaces of Al inter-gate electrode and at the two injection electrodes reduces after keeping the device for a long-enough time. Also, our simulating equations can be applied to other organic based OSITs under positive both V DS and V G.

源语言英语
文章编号095022
期刊Semiconductor Science and Technology
34
9
DOI
出版状态已出版 - 27 8月 2019

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