Independent bad block management for mass storage flash memory arrays

Yongfeng Ma, Hanping Du, Shaobo Yang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

As flash memory has advantages of high data throughput, high storage density, low power consumption and low cost, it has been widely used in the applications of high speed data acquisition and massive data storage. However, the flash chip generates bad blocks during its service life, which leads to the loss of data. Hence a bad block management in the system of flash memory array is essential to ensure the reliability of the data. The bad block management affects the storage capacity utilization, which is the main factor of the service life of the storage array. This paper introduces a new bad block management, in which each flash chip in the array has a corresponding bad block table. The computer simulation shows that the proposed scheme can improve the capacity utilization according to the size of the array.

源语言英语
主期刊名ICSESS 2015 - Proceedings of 2015 IEEE 6th International Conference on Software Engineering and Service Science
编辑M. Surendra Prasad Babu, Li Wenzheng
出版商IEEE Computer Society
388-391
页数4
ISBN(电子版)9781479983520
DOI
出版状态已出版 - 25 11月 2015
活动6th IEEE International Conference on Software Engineering and Service Science, ICSESS 2015 - Beijing, 中国
期限: 23 9月 201525 9月 2015

出版系列

姓名Proceedings of the IEEE International Conference on Software Engineering and Service Sciences, ICSESS
2015-November
ISSN(印刷版)2327-0586
ISSN(电子版)2327-0594

会议

会议6th IEEE International Conference on Software Engineering and Service Science, ICSESS 2015
国家/地区中国
Beijing
时期23/09/1525/09/15

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