TY - GEN
T1 - High-speed railway signal trackside equipment patrol inspection system
AU - Wu, Nan
N1 - Publisher Copyright:
© 2018 SPIE.
PY - 2018
Y1 - 2018
N2 - High-speed railway signal trackside equipment patrol inspection system comprehensively applies TDI (time delay integration), high-speed and highly responsive CMOS architecture, low illumination photosensitive technique, image data compression technique, machine vision technique and so on, installed on high-speed railway inspection train, and achieves the collection, management and analysis of the images of signal trackside equipment appearance while the train is running. The system will automatically filter out the signal trackside equipment images from a large number of the background image, and identify of the equipment changes by comparing the original image data. Combining with ledger data and train location information, the system accurately locate the trackside equipment, conscientiously guiding maintenance.
AB - High-speed railway signal trackside equipment patrol inspection system comprehensively applies TDI (time delay integration), high-speed and highly responsive CMOS architecture, low illumination photosensitive technique, image data compression technique, machine vision technique and so on, installed on high-speed railway inspection train, and achieves the collection, management and analysis of the images of signal trackside equipment appearance while the train is running. The system will automatically filter out the signal trackside equipment images from a large number of the background image, and identify of the equipment changes by comparing the original image data. Combining with ledger data and train location information, the system accurately locate the trackside equipment, conscientiously guiding maintenance.
KW - High-speed railway
KW - Inspection system
KW - Signal trackside equipment
UR - http://www.scopus.com/inward/record.url?scp=85045150939&partnerID=8YFLogxK
U2 - 10.1117/12.2314580
DO - 10.1117/12.2314580
M3 - Conference contribution
AN - SCOPUS:85045150939
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Young Scientists Forum 2017
A2 - Peng, Kunchi
A2 - Pan, Jianwei
A2 - Chu, Junhao
PB - SPIE
T2 - Young Scientists Forum 2017
Y2 - 24 November 2017 through 26 November 2017
ER -