Gate tunable MoS2-black phosphorus heterojunction devices

Peng Chen, Jianyong Xiang, Hua Yu, Jing Zhang, Guibai Xie, Shuang Wu, Xiaobo Lu, Guole Wang, Jing Zhao, Fusheng Wen, Zhongyuan Liu, Rong Yang, Dongxia Shi, Guangyu Zhang

科研成果: 期刊稿件文章同行评审

59 引用 (Scopus)

摘要

Heterojunctions are essential building blocks for modern electronic and optoelectronic devices. The recent discovery of two-dimensional semiconductors offers an opportunity to build these heterojunctions with atomic sharp interfaces by van der Waals interaction. Here we fabricated MoS2-black phosphorus (BP) heterojunction devices. Due to the narrow band-gap and unpinned Fermi level of BP, this heterojunction could be tuned to either p-nor n-n by the electrostatic gating. The current rectification behaviors were observed in both p-n and n-n junctions. The current rectification of the MoS2-BP n-n junction was attributed to the energy barrier formed at the interface of wide band-gap MoS2 and narrow band-gap BP. The gate dependence of forward current, reverse current and current rectification properties of the heterojunction at different thickness scale were systematically studied, suggesting the electrical properties of the heterojunction could be controlled by designing the thickness of MoS2 and BP flake.

源语言英语
文章编号034009
期刊2D Materials
2
3
DOI
出版状态已出版 - 15 7月 2015
已对外发布

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