Gate-Controlled Spin-Valley Locking of Resident Carriers in WSe2 Monolayers

P. Dey, Luyi Yang, C. Robert, G. Wang, B. Urbaszek, X. Marie, S. A. Crooker

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摘要

Using time-resolved Kerr rotation, we measure the spin-valley dynamics of resident electrons and holes in single charge-tunable monolayers of the archetypal transition-metal dichalcogenide (TMD) semiconductor WSe2. In the n-type regime, we observe long (∼130 ns) polarization relaxation of electrons that is sensitive to in-plane magnetic fields By, indicating spin relaxation. In marked contrast, extraordinarily long (∼2 μs) polarization relaxation of holes is revealed in the p-type regime, which is unaffected by By, directly confirming long-standing expectations of strong spin-valley locking of holes in the valence band of monolayer TMDs. Supported by continuous-wave Kerr spectroscopy and Hanle measurements, these studies provide a unified picture of carrier polarization dynamics in monolayer TMDs, which can guide design principles for future valleytronic devices.

源语言英语
文章编号137401
期刊Physical Review Letters
119
13
DOI
出版状态已出版 - 27 9月 2017
已对外发布

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