TY - JOUR
T1 - Fault diagnosis of Tennessee-eastman process using orthogonal incremental extreme learning machine based on driving amount
AU - Zou, Weidong
AU - Xia, Yuanqing
AU - Li, Huifang
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/12
Y1 - 2018/12
N2 - Fault diagnosis is important to the industrial process. This paper proposes an orthogonal incremental extreme learning machine based on driving amount (DAOI-ELM) for recognizing the faults of the Tennessee-Eastman process (TEP). The basic idea of DAOI-ELM is to incorporate the Gram-Schmidt orthogonalization method and driving amount into an incremental extreme learning machine (I-ELM). The case study for the 2-D nonlinear function and regression problems from the UCI dataset results show that DAOI-ELM can obtain better generalization ability and a more compact structure of ELM than I-ELM, convex I-ELM (CI-ELM), orthogonal I-ELM (OI-ELM), and bidirectional ELM. The experimental training and testing data are derived from the simulations of TEP. The performance of DAOI-ELM is evaluated and compared with that of the back propagation neural network, support vector machine, I-ELM, CI-ELM, and OI-ELM. The simulation results show that DAOI-ELM diagnoses the TEP faults better than other methods.
AB - Fault diagnosis is important to the industrial process. This paper proposes an orthogonal incremental extreme learning machine based on driving amount (DAOI-ELM) for recognizing the faults of the Tennessee-Eastman process (TEP). The basic idea of DAOI-ELM is to incorporate the Gram-Schmidt orthogonalization method and driving amount into an incremental extreme learning machine (I-ELM). The case study for the 2-D nonlinear function and regression problems from the UCI dataset results show that DAOI-ELM can obtain better generalization ability and a more compact structure of ELM than I-ELM, convex I-ELM (CI-ELM), orthogonal I-ELM (OI-ELM), and bidirectional ELM. The experimental training and testing data are derived from the simulations of TEP. The performance of DAOI-ELM is evaluated and compared with that of the back propagation neural network, support vector machine, I-ELM, CI-ELM, and OI-ELM. The simulation results show that DAOI-ELM diagnoses the TEP faults better than other methods.
KW - Driving amount
KW - Gram-Schmidt orthogonalization method
KW - Tennessee-Eastman process (TEP)
KW - fault diagnosis
UR - http://www.scopus.com/inward/record.url?scp=85047190108&partnerID=8YFLogxK
U2 - 10.1109/TCYB.2018.2830338
DO - 10.1109/TCYB.2018.2830338
M3 - Article
C2 - 29994325
AN - SCOPUS:85047190108
SN - 2168-2267
VL - 48
SP - 3403
EP - 3410
JO - IEEE Transactions on Cybernetics
JF - IEEE Transactions on Cybernetics
IS - 12
M1 - 8361786
ER -