TY - GEN
T1 - Fast sample technique in antenna time domain near field measurement
AU - Nan, Wang
AU - Zheng-Hui, Xue
AU - Shing-Ming, Yang
AU - Ruixiang, Liu
AU - Xiaowen, Xu
PY - 2007
Y1 - 2007
N2 - In the practice of antenna time domain planar near field measurement, the probe moving step by step in each sample point is not acceptable for the huge time spending. The effect of measuring results in case of probe continuously moving in one dimension has been analyses in this paper. From simulation, it can be find that sample in the condition of probe moving continuously has almost the same measuring precision as sample in the condition of probe moving in step, and the probe moving speed can be even much faster than it in frequency domain. It means that time domain near field measurement can support fast sample, and has more efficiency than frequency domain near field measurement.
AB - In the practice of antenna time domain planar near field measurement, the probe moving step by step in each sample point is not acceptable for the huge time spending. The effect of measuring results in case of probe continuously moving in one dimension has been analyses in this paper. From simulation, it can be find that sample in the condition of probe moving continuously has almost the same measuring precision as sample in the condition of probe moving in step, and the probe moving speed can be even much faster than it in frequency domain. It means that time domain near field measurement can support fast sample, and has more efficiency than frequency domain near field measurement.
KW - Fast sample
KW - Planar near field measurement
KW - Time domain
UR - http://www.scopus.com/inward/record.url?scp=47849127053&partnerID=8YFLogxK
U2 - 10.1109/ELMAGC.2007.4413542
DO - 10.1109/ELMAGC.2007.4413542
M3 - Conference contribution
AN - SCOPUS:47849127053
SN - 1424413729
SN - 9781424413720
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 507
EP - 510
BT - EMC'2007 - 2007 4th International Symposium on Electromagnetic Compatibility Proceeding
T2 - 2007 4th International Symposium on Electromagnetic Compatibility, EMC'2007
Y2 - 23 October 2007 through 26 October 2007
ER -