@inproceedings{ad4385109f2b47ef913ebc3f6a5149ec,
title = "Fast compressed channeled spectropolarimeter for full Stokes vector measurement",
abstract = "Channeled spectropolarimeter (CSP) measures the spectrally resolved Stokes vector of light from only one single spectral acquisition, which makes it possible to accurately measure dynamic events. The accurate reconstruction of Stokes vector plays a key role in this snapshot technique shifting the main burden of measurement to computational work. The state-ofthe-art algorithm runs the Fourier transform of the channeled spectrum or linear operator model of the system and its pseudo-inverse to reconstruct Stokes vector. However, they may suffer from the lack of signal-to-noise ratio (SNR) then reduce the accuracy of reconstruction. To accurately reconstruct Stokes vector from noise-contaminated data, we propose an effective method called fast compressed channeled spectropolarimeter (FCCSP). In our FCCSP method, the spectrum from spectrometer is seen as the compressive representation of Stokes vector, thus the FCCSP algorithm is to solve an underdetermined problem, where we reconstruct the 4N×1 Stokes vector from only N×1 spectral data acquisition points. Simulation results show that our FCCSP method is more accurate to reconstruct Stokes vector changing gradually with wavelength from noise-contaminated spectrum than Fourier and linear operator methods. Besides, it is faster and more memory and computation-friendly than other compressed CSP method.",
keywords = "Compressed sensing, Modulated polarimeter, Spectropolarimeter, Stokes vector",
author = "Guodong Zhou and Yanqiu Li and Jianhui Li and Jiazhi Wang",
note = "Publisher Copyright: {\textcopyright} 2019 SPIE.; Modeling Aspects in Optical Metrology VII 2019 ; Conference date: 24-06-2019 Through 26-06-2019",
year = "2019",
doi = "10.1117/12.2526089",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Bernd Bodermann and Karsten Frenner",
booktitle = "Modeling Aspects in Optical Metrology VII",
address = "United States",
}