@article{da1d34582c6d47b49cb3c8146d65d605,
title = "Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution",
abstract = "An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.",
author = "Le Yang and Chen, {Hao Sen} and Hanqing Jiang and Wei, {Yu Jie} and Song, {Wei Li} and Fang, {Dai Ning}",
note = "Publisher Copyright: {\textcopyright} 2018 The Royal Society of Chemistry.",
year = "2018",
doi = "10.1039/c7cc09708e",
language = "English",
volume = "54",
pages = "3997--4000",
journal = "Chemical Communications",
issn = "1359-7345",
publisher = "Royal Society of Chemistry",
number = "32",
}