Fabrication and structure of nanometer Zn1-xFexSe films

Lin Zhang*, Lian Sheng Zhang

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

Nanometer Zn1-xFexSe diluted magnetic semiconductor films are fabricated by the double-source deposition. The crystal structure and phonon spectrum feature of the films were studied by X-ray diffraction and Ra-man-scattered spectra. The results show that the lattice parameter of the nanocrystals in Zn1-xFexSe films increases linearly with Fe concentration. The phonon localized effect is observed obviously from the Raman-scattered spectrum. The Raman-scattered peak corresponding to the optical phonon mode for Zn1-xFexSe films displays the broadening and red-shifting with respect to the bulk ZnSe. The expansion of lattice for the nanocrystals results in that the red-shifting of Raman-scattered peak increases linearly with Fe concentration.

源语言英语
页(从-至)357-358+361
期刊Gongneng Cailiao/Journal of Functional Materials
36
3
出版状态已出版 - 3月 2005
已对外发布

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