摘要
Nanometer Zn1-xFexSe diluted magnetic semiconductor films are fabricated by the double-source deposition. The crystal structure and phonon spectrum feature of the films were studied by X-ray diffraction and Ra-man-scattered spectra. The results show that the lattice parameter of the nanocrystals in Zn1-xFexSe films increases linearly with Fe concentration. The phonon localized effect is observed obviously from the Raman-scattered spectrum. The Raman-scattered peak corresponding to the optical phonon mode for Zn1-xFexSe films displays the broadening and red-shifting with respect to the bulk ZnSe. The expansion of lattice for the nanocrystals results in that the red-shifting of Raman-scattered peak increases linearly with Fe concentration.
源语言 | 英语 |
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页(从-至) | 357-358+361 |
期刊 | Gongneng Cailiao/Journal of Functional Materials |
卷 | 36 |
期 | 3 |
出版状态 | 已出版 - 3月 2005 |
已对外发布 | 是 |