Exploiting the categorical reliability difference for binary classification

Lei Sun, Kar Ann Toh*, Badong Chen, Zhiping Lin

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

2 引用 (Scopus)

摘要

In binary pattern classification, the reliabilities of statistics obtained from the samples of the two categories are generally different. When the statistics are used for modeling a classifier, such reliability difference could impact the generalization performance. We formulate a disparity index to show the statistical disparity based on the generalized eigenvalue decomposition of the categorical moment matrices. It is shown that this disparity index can effectively indicate the reliability difference between the two categories. The obtained reliability difference is subsequently utilized to adjust the regularization term of a classifier for effective learning generalization. Our experiments based on 10 real-world benchmark data sets validate the effectiveness of the proposed method.

源语言英语
页(从-至)2022-2040
页数19
期刊Journal of the Franklin Institute
355
4
DOI
出版状态已出版 - 3月 2018

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