TY - JOUR
T1 - Experimental study on wax protective coating for wet deep silicon etching processes
AU - Jiang, Jian Liang
AU - Ulrich, Hilleringmann
PY - 2006/9
Y1 - 2006/9
N2 - In order to protect the finished structures on the front side during deep silicon wet etching processes, the wax coating for double-sided etching process on the wafer is studied to separate the aforementioned structures from the strong aqueous bases. By way of heating and vacuumization, the air bubbles are expelled from the coating to extend the protection duration. The air pressure in the sealed chamber is 0.0267 Pa, and the temperature of the heated wafer is 300°C. Two kinds of the wax are used, and the corresponding photos of the etched wafer and the protection times are given. In 75°C 10% KOH solution, the protection duration is more than 8 h.
AB - In order to protect the finished structures on the front side during deep silicon wet etching processes, the wax coating for double-sided etching process on the wafer is studied to separate the aforementioned structures from the strong aqueous bases. By way of heating and vacuumization, the air bubbles are expelled from the coating to extend the protection duration. The air pressure in the sealed chamber is 0.0267 Pa, and the temperature of the heated wafer is 300°C. Two kinds of the wax are used, and the corresponding photos of the etched wafer and the protection times are given. In 75°C 10% KOH solution, the protection duration is more than 8 h.
KW - Deep silicon etching
KW - Potassium hydroxide etchant
KW - Protective coating
UR - http://www.scopus.com/inward/record.url?scp=33751568665&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:33751568665
SN - 1004-0579
VL - 15
SP - 306
EP - 310
JO - Journal of Beijing Institute of Technology (English Edition)
JF - Journal of Beijing Institute of Technology (English Edition)
IS - 3
ER -