Evaluation of temperature and humidity on PV module degradation- in field degradation analysis of crystalline silicon module

Hailing Li, Fang Lv, Hongwei DIao, Xu Chen, Wenjing Wang

科研成果: 书/报告/会议事项章节会议稿件同行评审

6 引用 (Scopus)
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摘要

PV modules operated in humid and hot climate area in different sites with different operating years were investigated. The average degradation rate is 1.18%/y, higher than guarantee of 20% for 25 years (0.8%/y). By investigating modules from 3 plants operating for 3 years, 6 years and 15 years, the influence of operating year on degradation are studied. As reported before, corrosion of metallic materials is considered to be one of the main degradation models. We find linear relationship between FF and Pmax degradation, especially at the case with long operating year.

源语言英语
主期刊名2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
出版商Institute of Electrical and Electronics Engineers Inc.
1986-1990
页数5
ISBN(电子版)9781728104942
DOI
出版状态已出版 - 6月 2019
已对外发布
活动46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, 美国
期限: 16 6月 201921 6月 2019

出版系列

姓名Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN(印刷版)0160-8371

会议

会议46th IEEE Photovoltaic Specialists Conference, PVSC 2019
国家/地区美国
Chicago
时期16/06/1921/06/19

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引用此

Li, H., Lv, F., DIao, H., Chen, X., & Wang, W. (2019). Evaluation of temperature and humidity on PV module degradation- in field degradation analysis of crystalline silicon module. 在 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 (页码 1986-1990). 文章 8981241 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC40753.2019.8981241