Evaluation and testing of image quality of the Space Solar Extreme Ultraviolet Telescope

Jilong Peng, Zhong Yi, Shuhong Zhou, Qian Yu, Yinlong Hou, Shanshan Wang*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

For the space solar extreme ultraviolet telescope, the star point test can not be performed in the x-ray band (19.5nm band) as there is not light source of bright enough. In this paper, the point spread function of the optical system is calculated to evaluate the imaging performance of the telescope system. Combined with the actual processing surface error, such as small grinding head processing and magnetorheological processing, the optical design software Zemax and data analysis software Matlab are used to directly calculate the system point spread function of the space solar extreme ultraviolet telescope. Matlab codes are programmed to generate the required surface error grid data. These surface error data is loaded to the specified surface of the telescope system by using the communication technique of DDE (Dynamic Data Exchange), which is used to connect Zemax and Matlab. As the different processing methods will lead to surface error with different size, distribution and spatial frequency, the impact of imaging is also different. Therefore, the characteristics of the surface error of different machining methods are studied. Combining with its position in the optical system and simulation its influence on the image quality, it is of great significance to reasonably choose the processing technology. Additionally, we have also analyzed the relationship between the surface error and the image quality evaluation. In order to ensure the final processing of the mirror to meet the requirements of the image quality, we should choose one or several methods to evaluate the surface error according to the different spatial frequency characteristics of the surface error.

源语言英语
主期刊名2017 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam
出版商SPIE
ISBN(电子版)9781510617537
DOI
出版状态已出版 - 2018
活动2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 28 10月 201730 10月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10621
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期28/10/1730/10/17

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