摘要
Here, we report a facile method to generate a high density of atomic-scale defects in graphene on metal foil and show how these defects affect the electronic structures of graphene layers. Our scanning tunneling microscope measurements, complemented by first-principles calculations, reveal that the atomic-scale defects result in both the intervalley and intravalley scattering of graphene. The Fermi velocity is reduced in the vicinity area of the defect due to the enhanced scattering.
源语言 | 英语 |
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文章编号 | 143120 |
期刊 | Applied Physics Letters |
卷 | 103 |
期 | 14 |
DOI | |
出版状态 | 已出版 - 30 9月 2013 |