摘要
X band and Ka band front-ends are integretd into one measurement system in order to get radar cross section and images of complex objects, software defined radaio is applied in system design. Then ISAR processing technology is investigated to gain two dimension scattering centers distribution, and radar cross section imaging and CBP algorithm is verified to obtaining object information efficiently.
| 源语言 | 英语 |
|---|---|
| 主期刊名 | Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
| 页 | 516-520 |
| 页数 | 5 |
| DOI | |
| 出版状态 | 已出版 - 2008 |
| 活动 | 2008 China-Japan Joint Microwave Conference, CJMW 2008 - Shanghai, 中国 期限: 10 9月 2008 → 12 9月 2008 |
出版系列
| 姓名 | Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
|---|
会议
| 会议 | 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
|---|---|
| 国家/地区 | 中国 |
| 市 | Shanghai |
| 时期 | 10/09/08 → 12/09/08 |
指纹
探究 'Dual-frequency scattering measurement system for radar crosssection imaging' 的科研主题。它们共同构成独一无二的指纹。引用此
Hu, W., Sun, H., Fu, P., & Lv, X. (2008). Dual-frequency scattering measurement system for radar crosssection imaging. 在 Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008 (页码 516-520). 文章 4772483 (Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008). https://doi.org/10.1109/CJMW.2008.4772483