Design of a wide field of view infrared scene projector

Zhenyu Jiang*, Lin Li, Yi Fan Huang

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In order to make the projected scene cover the seeker's field-of-view promptly the conventional projection optical systems used for hardware-in-the-loop simulation test usually depend on the 5 axes flight-motion-simulator. Those flight-motion-simulator tables are controlled via servomechanisms. The servomechanism needs many axis position transducers and many electromechanical devices. The structure and controlling procedure of the system are complicated. It is hard to avoid the mechanical motion and controlling errors absolutely. The target image jitter will be induced by the vibration of mechanical platform, and the frequency response is limited by the structural performance. To overcome these defects a new infrared image simulating projection system for hardware-in-the-loop simulation test is presented in this paper. The system in this paper consists of multiple lenses joined side by side on a sphere surface. Each single lens uses one IR image generator or resistor array etc. Every IR image generator displays special IR image controlled by the scene simulation computer. The scene computer distributes to every IR image generator the needed image. So the scene detected by the missile seeker is integrated and uninterrupted. The entrance pupil of the seeker lies in the centre of the sphere. Almost semi-sphere range scene can be achieved by the projection system, and the total field of view can be extended by increasing the number of the lenses. However, the luminance uniformity in the field-of-view will be influenced by the joint between the lenses. The method of controlling the luminance uniformity of field-of-view is studied in this paper. The needed luminous exitance of each resist array is analyzed. The experiment shows that the new method is applicable for the hardware-in-the-loop simulation test.

源语言英语
主期刊名Optical Design and Testing III
DOI
出版状态已出版 - 2008
活动Optical Design and Testing III - Beijing, 中国
期限: 12 11月 200715 11月 2007

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
6834
ISSN(印刷版)0277-786X

会议

会议Optical Design and Testing III
国家/地区中国
Beijing
时期12/11/0715/11/07

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