TY - GEN
T1 - Design of a CGH wavefront generator for aspheric testing with wavefront tracing method
AU - Qi, Yuejing
AU - Wang, Ping
AU - Jiang, Yi
PY - 2007
Y1 - 2007
N2 - Aspheric surfaces are widely used in optical systems. Advanced testing technology is needed for the production of aspheric surfaces. Compensation method is a popular method for testing aspheric surfaces. In order to realize the certification of compensator that is composed of multiple lenses, reflective CGH whose diameter is smaller than that of aspheric surface is used as aspherical simulator to calibrate the compensator. The challenge of realizing the accurate certification of the compensator is of high accuracy design of CGH. According to optical propagation theory, wavefront tracing method is proposed in this dissertation. The derivation process of wavefront tracing method is given. By using this method, the phase function of CGH can be directly acquired. Simulators of many different aspheric surfaces are designed. The design results prove the feasibility of wavefront tracing method. Compared to ray tracing method, the wavefront tracing method can simplify the design process and improve the design accuracy.
AB - Aspheric surfaces are widely used in optical systems. Advanced testing technology is needed for the production of aspheric surfaces. Compensation method is a popular method for testing aspheric surfaces. In order to realize the certification of compensator that is composed of multiple lenses, reflective CGH whose diameter is smaller than that of aspheric surface is used as aspherical simulator to calibrate the compensator. The challenge of realizing the accurate certification of the compensator is of high accuracy design of CGH. According to optical propagation theory, wavefront tracing method is proposed in this dissertation. The derivation process of wavefront tracing method is given. By using this method, the phase function of CGH can be directly acquired. Simulators of many different aspheric surfaces are designed. The design results prove the feasibility of wavefront tracing method. Compared to ray tracing method, the wavefront tracing method can simplify the design process and improve the design accuracy.
UR - http://www.scopus.com/inward/record.url?scp=39049144822&partnerID=8YFLogxK
U2 - 10.1117/12.783863
DO - 10.1117/12.783863
M3 - Conference contribution
AN - SCOPUS:39049144822
SN - 9780819468802
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
T2 - 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Y2 - 8 July 2007 through 12 July 2007
ER -
