TY - JOUR
T1 - Design and reliability analysis of multi-scale security system for Micro-mini smart ammunition
AU - Zhang, Yan
AU - Lou, Wenzhong
AU - Wang, Dakui
AU - Liao, Maohao
N1 - Publisher Copyright:
© 2018, Springer-Verlag GmbH Germany, part of Springer Nature.
PY - 2019/6/1
Y1 - 2019/6/1
N2 - The traditional micro-electro-mechanical system (MEMS) fuze system cannot meet the requirement, the micro-Micro-mini smart ammunition micro-electro-mechanical fuze system tends to micro-miniaturization and intellectualization. Due to the complexity and diversity of failure mechanism and mode, the reliability data source is not sufficient, which makes it difficult to assess the reliability of the MEMS safety system. In this paper, a cross-scale security system for microelectromechanical fuse is proposed. Based on FORM method and G-PCM method, key failure modes and design parameters affecting system reliability are studied. An optimization design model based on key influence parameters of reliability is established and verified by experiments. The experimental results show that the system reliability after optimization is 0.99905, and the potential failure mode (latching reed) and the key influencing factors of reliability (the width of the latching reed) are obtained. In addition, the experimental and theoretical results are basically consistent, indicating the rationality and applicability of the reliability calculation method.
AB - The traditional micro-electro-mechanical system (MEMS) fuze system cannot meet the requirement, the micro-Micro-mini smart ammunition micro-electro-mechanical fuze system tends to micro-miniaturization and intellectualization. Due to the complexity and diversity of failure mechanism and mode, the reliability data source is not sufficient, which makes it difficult to assess the reliability of the MEMS safety system. In this paper, a cross-scale security system for microelectromechanical fuse is proposed. Based on FORM method and G-PCM method, key failure modes and design parameters affecting system reliability are studied. An optimization design model based on key influence parameters of reliability is established and verified by experiments. The experimental results show that the system reliability after optimization is 0.99905, and the potential failure mode (latching reed) and the key influencing factors of reliability (the width of the latching reed) are obtained. In addition, the experimental and theoretical results are basically consistent, indicating the rationality and applicability of the reliability calculation method.
UR - http://www.scopus.com/inward/record.url?scp=85053434596&partnerID=8YFLogxK
U2 - 10.1007/s00542-018-4122-9
DO - 10.1007/s00542-018-4122-9
M3 - Article
AN - SCOPUS:85053434596
SN - 0946-7076
VL - 25
SP - 2371
EP - 2384
JO - Microsystem Technologies
JF - Microsystem Technologies
IS - 6
ER -