摘要
Flexible ITO films were deposited by Ion Beam Assisted Deposition (IBAD) to decrease the substrate temperature. Especially, the effects of influences of SiO2 buffer layer on the properties of ITO films were studied. The results showed that the addition of SiO2 reduced the increase of X-ray peak intensity and the blue shift of X-ray peak point. The resistivity of ITO film is 1.21 × 10-3 Ω·cm and the transmittance about 85%. The film surface is comparatively smooth.
源语言 | 英语 |
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页(从-至) | 62-65 |
页数 | 4 |
期刊 | Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology |
卷 | 28 |
期 | SUPPL. |
出版状态 | 已出版 - 3月 2008 |
指纹
探究 'Deposition of indium tin oxide films on PET flexible substrate at room temperature' 的科研主题。它们共同构成独一无二的指纹。引用此
Yu, Z. N., Xiang, L. F., Xu, J., Xue, W., & Wang, H. Q. (2008). Deposition of indium tin oxide films on PET flexible substrate at room temperature. Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology, 28(SUPPL.), 62-65.