TY - GEN
T1 - Computer simulation of phase-shift algorithm
AU - Wang, Gang
AU - Yan, Ji Xiang
PY - 2010
Y1 - 2010
N2 - When applying phase-stepping interferometry to measure wavefront with aberration, distortion is caused by various factors and the main one is phase-shifting error from phase shifter. In this paper, the calculation theory and consequence in measurement error of the phase shift algorithm are discussed. These algorithms include traditional three-phase algorithm, traditional four-phase algorithm, traditional five-phase algorithm, carre algorithm, new compensating four-phase algorithm and new compensating five-phase algorithm. According to the theory analysis and computer stimulation, these methods are compared through introduce phase-shifting error, wavefront aberration and Gauss noise, the results show the new compensating five-phase algorithm is immune to phase-shifting error, and its result is insensitive to Gauss noise, it can improve measurement accuracy effectively.
AB - When applying phase-stepping interferometry to measure wavefront with aberration, distortion is caused by various factors and the main one is phase-shifting error from phase shifter. In this paper, the calculation theory and consequence in measurement error of the phase shift algorithm are discussed. These algorithms include traditional three-phase algorithm, traditional four-phase algorithm, traditional five-phase algorithm, carre algorithm, new compensating four-phase algorithm and new compensating five-phase algorithm. According to the theory analysis and computer stimulation, these methods are compared through introduce phase-shifting error, wavefront aberration and Gauss noise, the results show the new compensating five-phase algorithm is immune to phase-shifting error, and its result is insensitive to Gauss noise, it can improve measurement accuracy effectively.
KW - computer stimulation
KW - phase shift algorithm
KW - phase-shifting error
UR - http://www.scopus.com/inward/record.url?scp=78650913076&partnerID=8YFLogxK
U2 - 10.1117/12.869917
DO - 10.1117/12.869917
M3 - Conference contribution
AN - SCOPUS:78650913076
SN - 9780819483850
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Metrology and Inspection for Industrial Applications
T2 - Optical Metrology and Inspection for Industrial Applications
Y2 - 18 October 2010 through 20 October 2010
ER -