@inproceedings{cb7ae58abb1b4ea899ae5a3e50fb390c,
title = "Color speckle deflectometry for three-dimensional surface transient measurement",
abstract = "Transient measurement technology has broad application prospects in fields such as mirror processing, automotive painting, and precision mechanical processing. It can help us monitor and analyze instantaneous changes in the processing process in real-time. The existing contact and non-contact measurement methods have drawbacks in both non-destructive testing and transient measurement directions. This paper develops a transient measurement system for color speckle deflectometry, aiming to improve efficiency in the field of optical measurement. The core components of the system described in this paper include a liquid crystal display (LCD) screen, a camera, and a beam splitter. By using multi-channel speckle fusion and color correction, one color image is captured to achieve the same effect as the previous three monochromatic images. The gradient of each point on the surface under test (SUT) is obtained through speckle shift, and then the surface shape of the SUT is obtained through integration. The feasibility is verified by the actual measurement with a flat mirror. By utilizing these devices and methods, transient measurement of the three-dimensional shape of a mirror can be achieved, and reliable results can be obtained in both laboratory environments and processing sites. Compared with traditional measurement methods, this system not only has a significant improvement in measurement speed, but also can achieve non-destructive and in place measurement.",
keywords = "Coaxial system, Color speckle, Speckle deflectometry, Surface shape measurement, Transient measurement",
author = "Zichen Wang and Yao Hu and Qun Hao and Chuheng Xu and Liu, {Yuan Heng}",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE.; Optical Design and Testing XIII 2023 ; Conference date: 14-10-2023 Through 15-10-2023",
year = "2023",
doi = "10.1117/12.2686390",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Yongtian Wang and Kidger, {Tina E.} and Rengmao Wu",
booktitle = "Optical Design and Testing XIII",
address = "United States",
}