Cd-rich and Te-rich low-temperature photoluminescence in cadmium telluride

D. S. Albin*, D. Kuciauskas, J. Ma, W. K. Metzger, J. M. Burst, H. R. Moutinho, P. C. Dippo

*此作品的通讯作者

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25 引用 (Scopus)

摘要

Low-temperature photoluminescence emission spectra were measured in cadmium telluride (CdTe) samples in which composition was varied to promote either Cd or Te-rich stoichiometry. The ability to monitor stoichiometry is important, since it has been shown to impact carrier recombination. Te-rich samples show transitions corresponding to acceptor-bound excitons (∼1.58 eV) and free-electron to acceptor transitions (∼1.547 eV). In addition to acceptor-bound excitons, Cd-rich samples show transitions assigned to donor-bound excitons (1.591 eV) and Te vacancies at 1.552 eV. Photoluminescence is a noninvasive way to monitor stoichiometric shifts induced by post-deposition anneals in polycrystalline CdTe thin films deposited by close-spaced sublimation.

源语言英语
文章编号092109
期刊Applied Physics Letters
104
9
DOI
出版状态已出版 - 3 3月 2014
已对外发布

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