Cause Analysis of Bolt Seizure Failure and Experimental Study On Influencing Factors

Xiaoyu Liu, Aixuan Zhang, Zhongwei Zhang*, Kai Liu, Xinggao Zhu, Weiliang Chen

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

This paper analyzes the causes of thread seizure failure, and summarizes the main causes of bolt seizure failure. The thread connection combination of titanium alloy bolt and self-locking nut is selected, and the influence law of the main influencing factors (installation speed, installation preload, surface treatment and lubrication) on the seizure failure of threaded fasteners is studied by testing. It is found that the larger the installation speed and installation torque, the thread pair is more prone to occur seizure failure; The selection of appropriate surface treatment can improve the anti seizing ability of thread pair; Lubrication measures for threaded fasteners can effectively improve the anti seizure ability.

源语言英语
主期刊名2022 12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022
出版商Institute of Electrical and Electronics Engineers Inc.
1142-1145
页数4
ISBN(电子版)9781665472678
DOI
出版状态已出版 - 2022
已对外发布
活动12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022 - Baishan, 中国
期限: 27 7月 202231 7月 2022

出版系列

姓名2022 12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022

会议

会议12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022
国家/地区中国
Baishan
时期27/07/2231/07/22

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引用此

Liu, X., Zhang, A., Zhang, Z., Liu, K., Zhu, X., & Chen, W. (2022). Cause Analysis of Bolt Seizure Failure and Experimental Study On Influencing Factors. 在 2022 12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022 (页码 1142-1145). (2022 12th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CYBER55403.2022.9907686