摘要
In this paper, a system for measuring perpendicularity and parallelism derivation using a laser diode fiber aligned beam and CCD detector is described. A stable aligned laser diode beam is used to form datum planes by rotating scanner equipped with pentagonal prism. Using a linear array CCD detector as the sensing probe, the system can detect the deviation of height related to the datum plane directly and absolutely. The experiment result is shown in the paper.
| 源语言 | 英语 |
|---|---|
| 主期刊名 | Proceedings of SPIE - The International Society for Optical Engineering |
| 编辑 | Frederick Y. Wu, Shenghua Ye |
| 页 | 2-5 |
| 页数 | 4 |
| 出版状态 | 已出版 - 1996 |
| 已对外发布 | 是 |
| 活动 | Automated Optical Inspection for Industry - Beijing, China 期限: 6 11月 1996 → 7 11月 1996 |
出版系列
| 姓名 | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| 卷 | 2899 |
| ISSN（印刷版） | 0277-786X |
会议
| 会议 | Automated Optical Inspection for Industry |
|---|---|
| 市 | Beijing, China |
| 时期 | 6/11/96 → 7/11/96 |
指纹
探究 'Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism' 的科研主题。它们共同构成独一无二的指纹。引用此
Hao, Q., Liang, R., Cao, M., & Li, D. (1996). Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism. 在 F. Y. Wu, & S. Ye (编辑), Proceedings of SPIE - The International Society for Optical Engineering (页码 2-5). (Proceedings of SPIE - The International Society for Optical Engineering; 卷 2899).